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Test Solutions Product List and Ranking from 11 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

Test Solutions Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

  1. JMT Saitama//Other manufacturing
  2. ミニサーキットヨコハマ Tokyo//Electronic Components and Semiconductors
  3. セブンシックス Tokyo//Optical Instruments
  4. テレダイン・レクロイ・ジャパン Tokyo//Testing, Analysis and Measurement
  5. 5 アンドールシステムサポート 自動テストソリューション事業部 Tokyo//Industrial Electrical Equipment
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Test Solutions Product ranking

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

  1. Test solution "PCR" JMT
  2. PIC (Photonic Integrated Circuit) Test Solution セブンシックス
  3. PIC (Photonic Integrated Circuit) Test Solution セブンシックス
  4. USB3.0 Test Solution QPHY-USB3-Tx-Rx テレダイン・レクロイ・ジャパン
  5. 4 Many companies have adopted it! Automotive Test Solutions アンドールシステムサポート 自動テストソリューション事業部

Test Solutions Product List

1～15 item / All 15 items

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Non-magnetic test solution

Non-magnetic test solution

In addition to being non-magnetic, it also supports contact tests under various conditions such as high current loads, high temperature loads, and high-frequency characteristic tests!

We have successfully developed probes with low magnetic properties by processing parts made from materials we have uniquely selected to meet more advanced requirements. Additionally, thanks to our accumulated know-how, we can provide comprehensive proposals that include housing design and manufacturing. Please feel free to contact us when you need our services. 【Features】 ■ Components of probes other than springs are processed and manufactured in-house. ■ We can manufacture various custom probe tip shapes tailored to the contact target. ■ We are also open to consultations for items not included in the standard lineup. ■ In addition to non-magnetic properties, we can accommodate contact testing under various conditions, including high current loads, high-temperature loads, and high-frequency characteristics. *For more details, please download the PDF or feel free to contact us.

  • Other contract services

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USB Test Solution QPHY-USB

USB Test Solution QPHY-USB

Compliant with all tests using a real-time oscilloscope.

QPHY-USB is a complete signal capture and analysis system designed for USB 2.0 devices, hosts, and hubs, as specified by the USB-IF USB 2.0 electrical test specifications. The test software includes a full set of electrical inspections for USB 2.0, encompassing high-speed, full-speed, and low-speed, and is executed with LeCroy's QualiPHY automated testing and reporting software. QualiPHY displays a wiring diagram that visually confirms the correct connections of probes and cables, ensuring ease and reliability even for first-time testers. If test conditions need to be changed or if diagrams are required for interpreting test results, they will be displayed. Each measurement is indicated by the name specified in the specifications, and the acceptable ranges and pass/fail results for each parameter are provided. For more details, please contact us or refer to the catalog.

  • Other analyses
  • oscilloscope

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RFID Read/Write Test Solution

RFID Read/Write Test Solution

[Application Example] System measurement of RFID read/write tests using a radio wave dark box, signal analyzer, and programmable attenuator.

【Product Introduction】 ■ Signal Analyzer MSA538 The most popular model in the MSA500 series - Measurement frequency: 20kHz to 3.3GHz ■ High-Speed Programmable Attenuator MAT800 Series Maximum attenuation of 80dB. A multifunctional, fully programmable feature that allows for ultra-fast control of attenuation. ■ Portable Antenna Covers a frequency range of 300MHz to 6.2GHz with 9 types of antennas. ■ Shielded Room/Shielded Box Taurus Series MY1530 Large size suitable for large test objects. A turntable can be installed as an option. ● The current environment in offices and factories is filled with various radio waves. (Computers, servers, wireless LAN, etc.) ● Public wireless signals and radio waves from other offices come in from outside. (Mobile phones, wireless LAN, PHS) ● Measuring inside the shielded room blocks external noise and absorbs internal reflections, allowing for accurate measurements. ● (750MHz to 12.5GHz) Using a programmable attenuator, it is possible to simulate the limit receiving sensitivity. 【Target Wireless】... Weak radio waves / RFID in the 900MHz UHF band

  • Other electronic measuring instruments

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Millimeter Wave VNA Extender Module, THz Test Solution

Millimeter Wave VNA Extender Module, THz Test Solution

Up to 500GHz, the hardware adopts new design concepts and technological solutions, significantly enhancing the key performance indicators of the equipment.

The 3644A / 45A / 43Q / 49 / 49A / 49B millimeter wave VNA extender module has reached an international level in measurement speed, dynamic range, and measurement stability. In terms of hardware, it adopts new design concepts and technological solutions, significantly enhancing the key performance indicators of the equipment. The 3644A / 45A / 43Q / 49 / 49A / 49B millimeter wave VNA extender, 3640A millimeter wave frequency extension controller, and vector network analyzer together form a millimeter wave vector network analysis system, achieving flexible configurations of 5mm, 3mm, 2mm, and 1mm. The maximum frequency range reaches up to 500GHz. With advantages such as concise system configuration, user-friendly interface, and high testing accuracy, it enables complete S-parameter measurements of the millimeter wave networks under test. This system is widely used in research and development, manufacturing, and testing in the fields of millimeter wave components, MMICs, antennas, RCS, and materials.

  • Other measurement, recording and measuring instruments
  • Other electronic measuring instruments

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Terahertz Test Solution Ceyear Corporation

Terahertz Test Solution Ceyear Corporation

Achieving high performance in many fields.

Today, millimeter wave and terahertz technologies are widely used in the fields of radar, electronic interference, electronic reconnaissance, precision guidance, communications, inter-satellite communications, and other military electronic equipment. In the civilian sector, millimeter wave and terahertz technologies are applied in areas such as automotive collision avoidance radar, remote sensing, astronomical observation, and 6G communication systems. The development and utilization of millimeter wave and terahertz technologies are based on solving the challenges of testing and measurement in the millimeter wave and terahertz bands. The millimeter wave and terahertz test systems developed and manufactured by Ceyear achieve high performance in many areas, including vector network analysis, signal generation, spectral analysis, power measurement, antenna testing, radar cross-section (RCS) testing, and material electromagnetic parameter testing.

  • Time-frequency measurements
  • Signal Generator
  • Other electronic measuring instruments

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IMPACT(TM) Test Solution

IMPACT(TM) Test Solution

Quality and measurement accuracy without compromise at a low price! A packaged product that allows you to start measuring immediately.

The 『IMPACT(TM)』 is a low-cost packaged product that includes accessories for immediate measurement. Despite being a packaged product, it offers flexibility tailored to applications and individual measurements. It is suitable for the DC/CV and RF measurement needs of universities, government agencies, and research institutions. 【Features】 ■ Ready to start measuring immediately ■ Packaged product that includes accessories ■ Flexibility tailored to applications and individual measurements ■ For higher frequencies, options of 40GHz, 50GHz, and 67GHz are available, allowing for measurements at higher frequencies. *For more details, please refer to the PDF document or feel free to contact us.

  • others

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Test solution "PCR"

Test solution "PCR"

Test solution that does not damage solder balls or measurement substrates with soft contact!

"PCR" is an optimal test solution for high-spec packages aimed at the upcoming 5G and IoT era. It demonstrates excellent performance in high-frequency testing that requires low inductance, low resistance, and low contact characteristics. Additionally, its simple structure allows for easy maintenance, reducing downtime during socket replacement and enabling productivity improvements. 【Features】 ■ Does not damage measurement substrates, etc. ■ Excellent price competitiveness ■ Easy maintenance ■ Potential for productivity improvement *For more details, please request documentation or view the PDF data available for download.

  • Company：JMT
  • Price：Other
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  • Semiconductor inspection/test equipment
  • Printed Circuit Board

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PIC (Photonic Integrated Circuit) Test Solution

PIC (Photonic Integrated Circuit) Test Solution

Customize the optical integrated circuit you want to measure! Introducing our testing solutions.

We provide a wide range of PIC testing environments, including passive and active component testing and BER testers. Based on your requirements, we can customize the configuration for each optical integrated circuit you wish to measure. Please feel free to contact us when you need assistance. 【Features】 ■ We offer testing environments for a wide range of optical integrated circuits at the wafer level, die level, and component level. ■ We provide a one-stop solution from automation software and probe systems to optical/electrical/performance measurement systems. * You can download the Japanese and English versions of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

  • Tester

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PIC (Photonic Integrated Circuit) Test Solution

PIC (Photonic Integrated Circuit) Test Solution

Customize the optical integrated circuit you want to measure! It can also be used for spectral analysis and functional testing.

We offer "PIC (Photonic Integrated Circuit) Test Solutions." We provide a wide range of PIC test environments, including passive and active component testing and BER testers. According to your requirements, we can customize the appropriate configuration for each photonic integrated circuit (PIC) you wish to measure. 【Features】 ■ We provide test environments for a wide range of photonic integrated circuits, including passive components, active components, quantum photonics chips (dies), AWGs, and transceivers (transmission, BER) at the wafer level, die level, and component level. ■ We offer a one-stop solution from automation software and probe systems to optical/electrical/performance measurement systems. *For more details, please download the PDF or feel free to contact us.

  • Semiconductor inspection/test equipment

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All-in-One USB Test Solution 'GRL-V-UP'

All-in-One USB Test Solution 'GRL-V-UP'

Meeting the demands of stringent testing conditions! Introducing our power delivery/data loopback volume tester.

The "GRL-V-UP" is an all-in-one USB test solution that enables high-speed multi-port testing for manufacturing lines. It meets the stringent testing requirements for USB Type-C/PD hosts, hub modules, docks, monitors, chargers, and more, as demanded by quality control engineers. Adopting a scalable modular format, it can accommodate up to 10 test cards in a single 3U rack unit chassis. 【Features】 - Supports USB, USB PD 2.0, and PD 3.0 PPS negotiation - USB 2.0 / USB 3.2 Gen 1 (5Gbps) data loopback testing - Supports continuous loads of up to 1000W using 10 pieces of 100W VBUS test cards - Options for a single 100W Type-C card or dual 60W Type-C cards - The number of test cards can be adjusted as needed *For more details, please refer to the related links or feel free to contact us.

  • Other electronic measuring instruments
  • Other electric meters

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USB3.0 Test Solution QPHY-USB3-Tx-Rx

USB3.0 Test Solution QPHY-USB3-Tx-Rx

Ideal for compliance testing and debugging of SuperSpeed USB products.

In the compliance testing for SuperSpeed USB (USB 3.0), a digital oscilloscope with a wide bandwidth of over 40 GS/s high-speed sampling is required to support a high data rate of 5 Gbps. The SDA813Zi-A features a wide bandwidth of 13 GHz and simultaneous 40 GS/s high-speed sampling across four channels, allowing it to capture the fifth harmonic of 5 Gbps serial data. It can perform complex data processing, such as advanced jitter analysis and emulation of CTLE and reference channels, at high speed, making it an ideal measurement instrument for USB 3.0 testing. Additionally, the QPHY-USB3-Tx-Rx is a test package that automatically executes compliance testing for SuperSpeed USB in accordance with the USB-IF Electrical Test Specification Rev 0.9. It can be easily executed by directly calling up the menu from the oscilloscope software, and by following the graphical instructions provided, the corresponding tests can be reliably conducted. After completion, a report of the test results can be generated. For more details, please contact us or refer to the catalog.

  • Other analyses
  • oscilloscope

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Many companies have adopted it! Automotive Test Solutions

Many companies have adopted it! Automotive Test Solutions

Major automobile manufacturers such as BMW and Renault have adopted it! We build various ECU test environments with a rich product lineup of over 1000 modules.

As automotive systems become more complex and testing becomes more challenging, the PXI, PCI, and LXI products for function testing in automotive applications from Pickering, which we handle, are adopted by many well-known automotive companies. Based on our extensive track record in testing ABS brake modules, dashboards, transmission control, body control, and more, we offer a wide range of products that meet the needs of the automotive industry. 【Application Examples】 - ECU Testing - Environmental Testing - Switch Simulation - Electric Vehicle Battery Management System Testing - Automotive Road Management *For more details, please refer to the catalog or feel free to contact us.

  • Other Auto Parts

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Innovative testing solutions for wireless applications.

Innovative testing solutions for wireless applications.

This is a document introducing examples of RF switches used by Mini-Circuits!

The rapid increase in connection devices for wireless applications has led to a growing demand for fast, innovative, and cost-effective testing solutions. Cost reduction and improved test throughput are required from both the design verification stage and testing on the mass production line. This article presents examples of how Mini-Circuits' RF switches have been used to improve testing efficiency on the mass production line. [Contents] ■ Introduction ■ Switch Matrix and Automatic Signal Routing ■ Example 1: High-order Switching System for Mobile Network Testing ■ Case Study 2: Integration of Solid-State Switches for High-Speed Throughput *For more details, please refer to the PDF document or feel free to contact us.

  • Other electronic parts

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Test Solution Catalog 2021-22 (Japanese Version)

Test Solution Catalog 2021-22 (Japanese Version)

Supporting the efficiency of testing operations and cost reduction! A wide range of custom systems and lab accessories introduced.

This catalog introduces Mini-Circuits' "Test Solutions." It includes detailed information on "Product Line Overview," "Custom Systems," "Integrated Amplifiers," and "Lab Accessories." Mini-Circuits has supported numerous customers in streamlining their testing operations and reducing costs. We hope the information in this guide can provide useful ideas for customers engaged in similar testing operations. [Contents (Excerpt)] ■ Product Line Overview ■ Custom Systems ■ Integrated Amplifiers ■ Lab Accessories ■ Measurement Instruments ■ Panel Mount Structures *For more details, please refer to the PDF document or feel free to contact us.

  • switch

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Semight 1.6T Next-Generation Optical Communication Test Solution <Exhibition>

Semight 1.6T Next-Generation Optical Communication Test Solution <Exhibition>

To everyone in charge of next-generation optical communication evaluation, we would like to introduce cutting-edge test solutions that meet industry needs! Information about our exhibition at COMNEXT2025.

Semight Instruments is a global manufacturer providing advanced testing solutions in the fields of high-speed communication and semiconductors. We will be exhibiting the "1.6T high-speed interface evaluation solution," which will be unveiled for the first time in Japan at COMNEXT 2025. Key exhibition points: ▶ DCA1065 Sampling Oscilloscope (65GHz) Built-in 120GBaud clock recovery, sensitivity -5dBm, supports 1.6T ▶ CR3302 Clock Recovery Unit (120GBaud) Supports 25-120GBaud NRZ/PAM4 signals, strong against weak light ▶ 1.6T Desktop BERT (Bit Error Rate Tester) 53.125-106.25GBaud, MCB water-cooled, modular structure ▶ PXIe High-Precision SMU 4-quadrant operation, 1pA resolution, 1MS/s high-speed sampling, SCPI compatible Additionally, we plan to showcase many of Semight's best-selling products, including chip testers for semiconductors and optical communications. Experience Semight's innovative technology that meets the latest evaluation needs at the venue.

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  • oscilloscope

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